Highly n-doped, tensile-strained Ge grown on Si by molecular beam epitaxy
“Highly n-doped, tensile-strained Ge grown on Si by molecular beam epitaxy”
Keisuke Nishida, Xuejun Xu, Kentarou Sawano, Takuya Maruizumi, Yasuhiro Shiraki
Thin Solid Films 557, 66-69 (2014) DOI: https://doi.org/10.1016/j.tsf.2013.10.082(外部サイト)
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